X-ray Diffractometer DRON-8, X-ray Diffractometer DRON-7
Useful and hampering properties of a crystalline material are determined by its atomic structure and chemical composition. Therefore any material research in solid state physics or a technological process in semiconductor electronics requires non-destructive testing with X-ray diffraction technique. X-ray diffractometers DRON-7 and DRON-8 allow studying phase composition and structural characteristics in controlled sample environment to get a material or a product with desired properties.
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Bourevestnik, Inc. |
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| E-Mail: | bourevestnik@bourevestnik.spb.ru | All services |
| Phone: | +7 (812) 676 1001 | |
| Fax: | +7 (812) 528 6633 | |
